Failure Analysis of Electronic Parts(Detecting Pinholes)
Nawadays,wiring patterns for electronic Parts has being fine delicately.
Once failure occurred in the parts which have patterns of micron-order width, it is very difficult, because of their micro sizes, to pinpoint where the failure occurred to analyze the cause.
Visible light has been used to detect tiny pinhole in the patterns of printed circuit board so far.
However, since the visibility depends on the lighting angle, it has not been assured to detect pinholes.
On the contrary, TVS captures passively the infrared radiation from the object, and can detect pinholes without any constraint from view position with distinguishing a high temperature points since black body effect is applied. In this way, TVS is widely used for failure analysis applications.
